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HB01200 - SEMI HB12 - Specification for Dry-Etched Patterned Sapphire Substrates (DPSS) Revision:SEMI HB12-1219 - Current 1-0921 (technical revision)

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Description

1-0921 (technical revision)

is considered outside the scope of this Test Method

SEMI F57-0120 (technical revision)

originally used for indicating optical direction of the films

requires additional thermal processing following growth to bring the resistivity to a level > 107 Ω-cm

HB01200 - SEMI HB12 - Specification for Dry-Etched Patterned Sapphire Substrates (DPSS) Revision:SEMI HB12-1219 - Current 1-0921 (technical revision)As the high brightness light emitting diode (HB LED) and patterned sapphire substrate (PSS) industry is under rapid development, it is very necessary to establish the standard for PSS products, which can provide a clear and common basis to meet the demands of research and development, production and sale for light emitting diode (LED) industry. Because the PSS industry belongs to the upstream in the whole LED industry, a sound standard and

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